By Topic

Accurate Chromatic Dispersion Characterization of Photonic Integrated Circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
4 Author(s)
Mas, S. ; Valencia Nanophotonics Technol. Center, Univ. Politec. de Valencia, Valencia, Spain ; Matres, J. ; Marti, J. ; Oton, C.J.

An accurate technique to characterize chromatic dispersion and its slope versus wavelength is reported. The method is based on a heterodyne Mach-Zehnder interferometer, which is immune to thermal phase noise by using a counterpropagating reference beam. Chromatic dispersion profiles are obtained over a broad wavelength region even in short waveguides with considerable loss. Conventional strip silicon waveguides as well as slotted geometries are considered. Theoretical simulations are also presented for comparison, which show good agreement with the experimental results.

Published in:

Photonics Journal, IEEE  (Volume:4 ,  Issue: 3 )