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Study on nondestructive measurement with electronic speckle pattern interferometry method

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5 Author(s)
Liu Jing ; Dept. of Electrician & Electron, Aviation Univ. of Air Force, Changchun, China ; Jin Meishan ; Li Jing ; Gao Ling
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In recent years, With the high-speed development of electronic computer technology, optic-electronical technique and image processing technology, Electronic Speckle Pattern Interferometry (ESPI for short) has become one of the most practical worthy techniques for speckle measuring methods. There are lots of advantages about it, such as uncomplicated operation, noncontacting, advanced automatic level, measurement on-line and extensive using. In this thesis, the physical quantity which directly reflects the situation of thermal deformation for the aluminum material can be obtained by using this method. Thus we can come to a conclusion that electronic speckle pattern interferometry is a new measuring method for extracting small-signal. It provides a powerfully theoretical and experimental platform for the study of automated, full-field and nondestructive measurement (NDE for short).

Published in:

Consumer Electronics, Communications and Networks (CECNet), 2012 2nd International Conference on

Date of Conference:

21-23 April 2012