By Topic

Differential Thermal Analysis of Nanostructured Si0.80Ge0.20 Thermoelectric Material

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Lobat Tayebi ; Helmerich Adv. Technol. Res. Center, Tulsa, OK, USA ; Zahra Zamanipour ; Masoud Mozafari ; Payam Norouzzadeh
more authors

Thermoelectric effect becomes one of the important elements in sustainable energy due to its capability in green conversion of waste heat into electrical energy. Among various thermoelectric materials, nanostructured-Si0.80Ge0.20 is being widely investigated owing to its efficient thermoelectric effect at high temperature. In this manuscript, we studied differential thermal analysis (DTA) of Si0.80Ge0.20 thermoelectric alloy in detail. Our DTA study revealed the fact that in almost all alloys of nanostrcutured Si0.80Ge0.20 prepared with mechanical ball milling, the sample is not in Si0.80Ge0.20 phase but is in composite mixed phases of Si0.88Ge0.12 and small amount of Si0.55Ge0.45. This phase impurity can hardly be seen in X-ray diffraction patterns and is often neglected.

Published in:

Green Technologies Conference, 2012 IEEE

Date of Conference:

19-20 April 2012