Cart (Loading....) | Create Account
Close category search window
 

A New High-Efficient Spectral-Domain Analysis of Single and Multiple Coupled Microstrip Lines in Planarly Layered Media

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Lucido, M. ; Dipt. di Ing. Elettr. e dell''Inf. (DIEI), Univ. of Cassino, Cassino, Italy

The analysis of propagation of bound and leaky modes in single and multiple coupled microstrip lines in planarly layered media by means of Galerkin's method applied to an electric field integral-equation formulation in the spectral domain with Chebyshev polynomials basis functions weighted with the edge behavior of the unknown surface current densities on the metallic strips leads to the evaluation of improper integrals of oscillating functions with a slow asymptotic decay. In this paper, a new analytical technique for drastically speeding up the computation of such integrals is presented. First, suitable half-space contributions are pulled out of the kernels, which makes the integrands exponentially decaying functions. The integrals of the extracted contributions are then expressed as combinations of proper integrals and fast converging improper integrals by means of appropriate integration procedures in the complex plane.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:60 ,  Issue: 7 )

Date of Publication:

July 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.