By Topic

Look-up table-based digital predistorter implementation for field programmable gate arrays using long-term evolution signals with 60 mhz bandwidth

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Kwan, A. ; Dept. of Electr. & Comput. Eng., Univ. of Calgary, Calgary, AB, Canada ; Ghannouchi, F.M. ; Hammi, O. ; Helaoui, M.
more authors

This study discusses the implementation of a digital predistorter to linearise radiofrequency (RF) power amplifiers, using input signals 60 MHz in bandwidth. The digital predistorter characterisation procedure is performed on a digital signal processor, using a memory polynomial modelling technique with QR-based recursive least squares (QR-RLS) as the extraction procedure. A multiple look-up table design for the memory polynomial predistorter is introduced, and by using fixed-point operations, reduces the processing latency considerably when compared with a floating-point-based predistorter implementation on a field programmable gate array (FPGA). Linearisation results are shown for a laterally diffused metal oxide semi-conductor (LDMOS)-based power amplifier (PA) biased in class AB operation with a three-carrier long-term evolution-time division duplex (LTE-TDD) input signal. Combining both the optimised predistortion coefficient extraction and predistorter implementation gives up to 20 dBc improvement in the adjacent channel and meets the wireless communication standard requirements.

Published in:

Science, Measurement & Technology, IET  (Volume:6 ,  Issue: 3 )