Cart (Loading....) | Create Account
Close category search window

Controller for a high strain shape memory alloy actuator: quenching of limit cycles

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Grant, D. ; Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada ; Hayward, V.

Further development of a three level switching controller (Grant and Hayward, 1995) is presented. The controller was originally designed to drive a novel shape memory alloy (SMA) actuator consisting of a number of thin NiTi fibers woven in a counter rotating helical pattern around supporting disks. While the original controller performed satisfactorily, it was hampered by the presence of limit cycles at higher gains. By allowing the upper switching level to be proportional to the velocity if is possible to achieve a damped response, analogous to PD control for linear systems, effectively quenching the limit cycle. With this damping, it is possible to decrease the rise time by almost half and maintain the same steady state accuracy

Published in:

Robotics and Automation, 1997. Proceedings., 1997 IEEE International Conference on  (Volume:1 )

Date of Conference:

20-25 Apr 1997

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.