By Topic

Experimental Comparison of Test Case Generation Methods for Finite State Machines

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Andre Takeshi Endo ; Inst. de Cienc. Mat. e de Comput., Univ. de Sao Paulo (USP), Sao Paulo, Brazil ; Adenilso Simao

Testing from finite state machines has been widely investigated due to its well-founded and sound theory as well as its practical application in different areas, e.g., Web-based systems and protocol testing. There has been a recurrent interest in developing methods capable of generating test suites that detect all faults in a given fault domain. However, the proposal of new methods motivates the comparison with traditional methods. In this context, we conducted a set of experiments that compares W, HSI, H, SPY, and P methods. The results have shown that H, SPY, and P methods produce smaller test suites than traditional methods (W, HSI). Although the P method presented the shortest test suite in most cases, its reduction is smaller compared with H and SPY. We have also observed that the reduction ratio in partial machines is smaller than that in complete machines.

Published in:

2012 IEEE Fifth International Conference on Software Testing, Verification and Validation

Date of Conference:

17-21 April 2012