Cart (Loading....) | Create Account
Close category search window
 

An Empirical Study of Pre-release Software Faults in an Industrial Product Line

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Devine, T.R. ; Lane Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA ; Goseva-Popstajanova, K. ; Krishnan, S. ; Lutz, R.R.
more authors

There is a lack of published studies providing empirical support for the assumption at the heart of product line development, namely, that through structured reuse later products will be less fault-prone. This paper presents results from an empirical study of pre-release fault and change proneness from four products in an industrial software product line. The objectives of the study are (1) to determine the association between various software metrics, as well as their correlation with the number of faults at the component level, (2) to characterize the fault and change proneness at various degrees of reuse, and (3) to determine how existing products in the software product line affect the quality of subsequently developed products and our ability to make predictions. The research results confirm, in a software product line setting, the findings of others that faults are more highly correlated to change metrics than to static code metrics. Further, the results show that variation components unique to individual products have the highest fault density and are the most prone to change. The longitudinal aspect of our research indicates that new products in this software product line benefit from the development and testing of previous products. For this case study, the number of faults in variation components of new products is predicted accurately using a linear model built on data from the previous products.

Published in:

Software Testing, Verification and Validation (ICST), 2012 IEEE Fifth International Conference on

Date of Conference:

17-21 April 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.