Cart (Loading....) | Create Account
Close category search window
 

Performance analysis of the decorrelating detector in the presence of synchronization errors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Uppala, S.V. ; Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA ; Sahr, J.D.

We present a semi-analytic method for computing the bit error rate of the decorrelating detector in the presence of phase and timing errors (synchronization errors). These errors in effect introduce multiple access interference. We first compute the moment generating function of the variate which determines the probability of error of a user. It can be shown that the probability of error is obtained by computing the Laplace inverse integral of a modified version of the moment generating function. Helstrom (1986) used this approach to analyze a BPSK system corrupted with intersymbol interference. In this paper are show that this method can be used for computing the probability of errors of users in the presence of multiple access interference. Due to the analytic approach used systems with larger packet sizes and larger user populations can be tackled

Published in:

Communications, Computers and Signal Processing, 1997. 10 Years PACRIM 1987-1997 - Networking the Pacific Rim. 1997 IEEE Pacific Rim Conference on  (Volume:1 )

Date of Conference:

20-22 Aug 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.