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Wafer level approaches for the integration of carbon nanotubes in electronic and sensor applications

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7 Author(s)
Hermann, S. ; Center for Microtechnologies (ZfM), Chemnitz Univ. of Technol., Chemnitz, Germany ; Fiedler, H. ; Haibo, Y. ; Loschek, S.
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In this work we give an overview about recent developments in the integration technology of CNTs. We focus on wafer level approaches with the CVD and DEP method for growing as well as depositing CNTs in a defined way. So that we present methods to manipulate CNT growth structure, growth mode as well as growth inhibition in thermal CVD processes. This is highlighted by a unique growth structure opening new possibilities for CNT integration. Likewise, we show recent developments in scaling up the DEP method on wafer level. We round it up with the fabrication of CNT vias and MEMS structures containing CNT sensor elements.

Published in:
Systems, Signals and Devices (SSD), 2012 9th International Multi-Conference on

Date of Conference: 20-23 March 2012

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