By Topic

Target identification enhancement using a combination of linear sampling method and adjoint sensitivity analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Eskandari, A.R. ; Dept. of Electr. & Comput. Eng., Islamic Azad Univ., Tehran, Iran ; Naser-Moghaddasi, M. ; Virdee, B.S.

This study describes a technique for complete identification of a two-dimensional scattering object using microwaves where the scatterer is assumed to be a homogenous dielectric medium. The employed technique assumes no prior knowledge of the scatter's material properties like electric permittivity and conductivity, and the far-field pattern is used as the only primary information in identification. The hybrid approach proposed consists of initially retrieving the shape and the position of the scattering object using a linear sampling method and then determining the electric permittivity and conductivity of the scatterer using adjoint sensitivity analysis. The technique results in high computational speed, efficiency and stability. In addition, the technique can be generalised for any scatterer structure. Numerical results are used to validate the feasibility of the proposed approach.

Published in:

Microwaves, Antennas & Propagation, IET  (Volume:6 ,  Issue: 4 )