By Topic

Local elasticity and lubrication measurements using atomic force and friction force microscopy at ultrasonic frequencies

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Scherer, V. ; Dept. of Mech. Eng., Ohio State Univ., Columbus, OH, USA ; Bhushan, B. ; Rabe, Ute ; Arnold, Walter

We have modified an Atomic Force Microscope (AFM) that allows the detection of cantilever bending as well as torsional vibrations at ultrasonic frequencies. Oscillating either probe tip or sample vertically modulates the normal force about the setpoint force, acting between tip and sample. When the tip contacts the sample, the surface resists the oscillation and deformation of the sample is dependent on the local stiffness or elasticity. For a constant normal force, a soft area deforms more than a hard area and thus the cantilever deflection is less over a soft area. The variations in cantilever vertical oscillation is a measure of relative elasticity of the sample. Elasticity maps with a lateral resolution of better than 100 nm have been taken on alumina-based ceramic composite, and on two metal particle (MP) recording tapes. By vibrating the sample laterally, the shear forces are modulated. Detecting and analyzing the cantilever torsional behavior, we are able to characterize friction and viscosity of thin films used for lubrication of magnetic disks

Published in:

Magnetics, IEEE Transactions on  (Volume:33 ,  Issue: 5 )