By Topic

Effects of surface/interface morphology on giant magnetoresistance and magnetic field sensitivity of NiO-based spin-valves

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
De-Hua Han ; Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA ; Jian-Gang Zhu ; J. H. Judy ; J. M. Sivertsen

The effects of surface/interface morphology on the giant magnetoresistance (GMR) and magnetic field sensitivity (MFS) of NiFe/Co/Cu/Co/NiFe/NiO/Si and Co/Cu/Co/NiO/Si bottom spin-valve films were studied. The NiO-based spin valves were fabricated on NiO films with different surface roughnesses. A GMR of 4.02% and a MFS of 0.83%/Oe were obtained from the spin-valves with a smoother surface/interface. A GMR of 5.46% and a MFS of 0.22%/Oe in low field and a GMR of 6.26% and a MFS of 0.16%/Oe in high field were obtained from the spin-valve films with a rougher surface/interface. It was found that the smoother the surface of the spin-valve films, the smaller the GMR but the larger the MFS. On the other hand, the rougher the surface of the spin-valve films, the larger the GMR but the smaller the MFS. The mechanism for surface/interface morphology affecting the GMR and MFS is also explored

Published in:

IEEE Transactions on Magnetics  (Volume:33 ,  Issue: 5 )