Cart (Loading....) | Create Account
Close category search window

Interfacing resistances in conducting probe atomic force microscopy with carbon nanotubes functionalised tips

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Rius, G. ; Toyota Technol. Inst., Nagoya, Japan ; Yoshimura, M.

A comparative study for the evaluation of carbon nanotube (CNT) functionalised tips as an interface for the determination of electrical and electronic properties of the surface of materials and devices is presented. The results of current spectroscopy measurements, complemented with force-current testing, reveal a strong dependence of the establishment of tip-sample electrical contact with environmental conditions and procedure. Multiwalled CNT-mediated measurements are compared with the results by commonly used as-purchased probes, metal-coated and Si probes, upon an inert and low-resistance Au substrate. The introduction of CNTs in the tip vicinity represents a drastic advance in the conduction capability as compared with the silicon probes. Despite a certain reduction of conduction as compared with metal-coated probes, a significant improvement of tip apex durability, together with, non-invasive mechanical contact to the sample is demonstrated. The present multiwalled CNT probes are proposed as an ideal element for electronic studies at the nanometre scale by atomic force microscopy.

Published in:

Micro & Nano Letters, IET  (Volume:7 ,  Issue: 4 )

Date of Publication:

April 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.