Referenced Items are not available for this document.
The following topics were dealt with: architectures; fault modelling; low-power circuits; embedded memories; memory testing; and software tools
Published in:
Memory Technology, Design and Testing, 1997. Proceedings., International Workshop on
Date of Conference: 11-12 Aug. 1997
- Meeting Date :
- 11 Aug 1997-12 Aug 1997
- ISSN :
- 1087-4852
- Print ISBN:
- 0-8186-8099-7
- INSPEC Accession Number:
- 5766670
- Conference Location :
- San Jose, CA, USA
- Digital Object Identifier :
- 10.1109/MTDT.1997.619386
- Product Type:
- Conference Publications
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