By Topic

The problem providing reliability of radio electronic means in terms operating vagueness

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Shynkaruk, O. ; Khmelnitsky Nat. Univ., Khmelnitsky, Ukraine ; Sobchenko, V.

The problems of forecasting the reliability of complex technical systems are examined with providing of minimum approximation error indexes and the possibility of removal operational vagueness of parameters.

Published in:

Modern Problems of Radio Engineering Telecommunications and Computer Science (TCSET), 2012 International Conference on

Date of Conference:

21-24 Feb. 2012