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Browse Journals & Magazines > Applied Physics Letters ...> Volume:100 Issue:18 Help

Ultra-low-phase-noise cryocooled microwave dielectric-sapphire-resonator oscillators

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3 Author(s)
Hartnett, J.G. ; School of Physics, University of Western Australia, 35 Stirling Hwy, Crawley 6009 WA, Australia ; Nand, N.R. ; Chuan Lu

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.4709479 

Two nominally identical ultra-stable microwave oscillators are compared. Each incorporates a sapphire resonator cooled to near 6 K in an ultra-low vibration cryostat using a pulse-tube cryocooler. The phase noise for a single oscillator is measured at -105 dBc/Hz at 1 Hz offset on the 11.2 GHz carrier. The oscillator fractional frequency stability, after subtracting a linear frequency drift of 3.5×10-14/day, is characterized by 5.3×10-16τ-1/2+9×10-17 for integration times 0.1s<τ<1000s and is limited by a flicker frequency noise floor near 1×10-16.

Published in:
Applied Physics Letters  (Volume:100 ,  Issue: 18 )

Date of Publication: Apr 2012

Page(s):
183501 - 183501-4
ISSN :
0003-6951
Digital Object Identifier :
10.1063/1.4709479
Product Type:
Journals & Magazines
Date of Current Version :
03 May 2012
Issue Date :
Apr 2012

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