By Topic

Closed-Form Expressions for the Maximum Transient Noise Voltage Caused by an IC Switching Current on a Power Distribution Network

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Jingook Kim ; Sch. of Electr. & Comput. Eng., Ulsan Nat. Inst. of Sci. & Technol., Ulsan, South Korea ; Liang Li ; Songping Wu ; Hanfeng Wang
more authors

Closed-form expressions for transient power distribution network (PDN) noise caused by an IC switching current are derived for a PDN structure comprised of traces with decoupling capacitors. Criteria for identifying a dominant decoupling capacitor for an impulse switching current are also proposed. The derived PDN noise expressions are validated with measurements of currents at both local and bulk capacitors, the PDN impedance, and the total voltage noise in an operating consumer device.

Published in:

Electromagnetic Compatibility, IEEE Transactions on  (Volume:54 ,  Issue: 5 )