By Topic

The LUT-SR Family of Uniform Random Number Generators for FPGA Architectures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Thomas, D.B. ; Department of Electrical and Electronic Engineering, Imperial College London, London, U.K. ; Luk, W.

Field-programmable gate array (FPGA) optimized random number generators (RNGs) are more resource-efficient than software-optimized RNGs because they can take advantage of bitwise operations and FPGA-specific features. However, it is difficult to concisely describe FPGA-optimized RNGs, so they are not commonly used in real-world designs. This paper describes a type of FPGA RNG called a LUT-SR RNG, which takes advantage of bitwise xor operations and the ability to turn lookup tables (LUTs) into shift registers of varying lengths. This provides a good resource–quality balance compared to previous FPGA-optimized generators, between the previous high-resource high-period LUT-FIFO RNGs and low-resource low-quality LUT-OPT RNGs, with quality comparable to the best software generators. The LUT-SR generators can also be expressed using a simple C++ algorithm contained within this paper, allowing 60 fully-specified LUT-SR RNGs with different characteristics to be embedded in this paper, backed up by an online set of very high speed integrated circuit hardware description language (VHDL) generators and test benches.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:21 ,  Issue: 4 )