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Constrained Placement Methodology for Reducing SER Under Single-Event-Induced Charge Sharing Effects

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6 Author(s)
Entrena, L. ; Electronic Technology Department, University Carlos III of Madrid, Madrid, Spain ; Lindoso, A. ; Millan, E.S. ; Pagliarini, S.
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This paper presents a methodology to reduce the impact of double faults in a circuit by constraining the placement of its standard cells. A fault-injection emulation platform is used to analyze the single-event-induced charge sharing effect in every pair of nodes. Based on the sensitivity of each pair, guidelines are set in a commercial standard cell placement by using constraints. Results show that by correctly choosing the nodes location, the error rate resulting from double faults can be reduced compared to single fault.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:59 ,  Issue: 4 )

Date of Publication:

Aug. 2012

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