Cart (Loading....) | Create Account
Close category search window
 

A novel sample reuse methodology for fast statistical simulations with applications to manufacturing variability

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kanj, R. ; IBM TJ Watson Labs., Yorktown Heights, NY, USA ; Joshi, R.

In this paper we propose a highly efficient statistical simulation methodology based on sample reuse. In the event of design re-centering, multiple manufacturing variability corners, or statistical sensitivity analysis the methodology enables design yield estimations at no additional cost to the reference center analysis. Sample points from the reference center statistical simulation can be utilized to estimate the yield at multiple neighboring centers. The capabilities of the methodology are further extended by projecting the new center onto the critical fail/sampling direction of the reference simulation. This improves the accuracy of the estimate and widens the scope of application. Theoretical applications and analysis of state of the art memory designs indicate excellent yield estimate matching and several orders of magnitude of speedup due to sample reuse.

Published in:

Quality Electronic Design (ISQED), 2012 13th International Symposium on

Date of Conference:

19-21 March 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.