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Fast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge Collection

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2 Author(s)
Hsuan-Ming Huang ; Dept. of the Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan ; Wen, C.H.-P.

Soft errors are a growing concern in highly scaled CMOS technologies; estimating error rates for a given design remains very challenging. This article presents a fast statistical soft-error-rate analysis approach that is nearly as accurate as computationally complex Monte Carlo SPICE simulation.

Published in:

Design & Test, IEEE  (Volume:30 ,  Issue: 2 )