Cart (Loading....) | Create Account
Close category search window
 

Social network link predict based on AF model

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Cheng Chang ; Sch. of Inf. & Commun. Eng., Beijing Univ. of Posts & Telecommun., Beijing, China ; Xiying Yao

With the development of the Internet, social network has deeply rooted. People could construct more widely contact through social network. At the same time, social network analysis has made in-depth development; it has been widely used in modern sociology, anthropology, economics, and biology area. In social network, everyone has his wish to expand his circle of communication. But their energy of digging the potential friends by themselves is limited, so the link prediction which is one of sub-tasks of social network analysis becomes increasingly important. This article uses the AF model for link prediction to social network, Verify the correctness and validity of the method through the experiment on Enron's e-mail data collection.

Published in:

Computer Science and Network Technology (ICCSNT), 2011 International Conference on  (Volume:1 )

Date of Conference:

24-26 Dec. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.