Cart (Loading....) | Create Account
Close category search window
 

Functional interface between brain and central pattern generator for application in human-machine system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Dingguo Zhang ; State Key Lab. of Mech. Syst. & Vibration, Shanghai Jiao Tong Univ., Shanghai, China ; Lin Yao ; Ying Wang ; Xiangyang Zhu

In this paper, a functional interface between brain and central pattern generator (CPG) is designed in an engineering perspective, which may serve in a human-machine system. Steady-state visual evoked potential (SSVEP) based brain-computer interface (BCI) is used to recognize five types of intention related to human walking. After feature extraction, classification and command translation on electroencephalography (EEG) signals, the human intention can control CPG to generate desired motor patterns for walking. Four subjects take part in BCI experiment, the successful classification accuracy are above 80%. Also the CPG model can accomplish the desired changes using online EEG data.

Published in:

Robotics and Biomimetics (ROBIO), 2011 IEEE International Conference on

Date of Conference:

7-11 Dec. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.