By Topic

Performance testing and assessment of Merging Units using IEC61850

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Uzoamaka Anombem ; University of Manchester, UK ; Haiyu Li ; Peter Crossley ; Wen An
more authors

The introduction of IEC61850 offers many advantages including interoperability and flexibility, and helps to reduce downtime that occurs as a result of upgrades that may be applied within a substation, due to technology changes. One application of IEC61850 is at the process level, where a Merging Unit samples the output of current and voltage transformers (CTs/VTs), and sends the standardized digitized output to the required protection and control devices. The design and development of a Merging Unit (MU) test system will be discussed. A number of performance tests will be carried out on the MU.

Published in:

Advanced Power System Automation and Protection (APAP), 2011 International Conference on  (Volume:2 )

Date of Conference:

16-20 Oct. 2011