Close category search window
 

Development of dynamic test system for digital relay protection based on IEC61850 standards

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Tang Baofeng ; Power Syst. Digital Simulation Lab., Hebei Electr. Power Res. Inst., Shijiazhuang, China ; Li Xianmei ; Yang Xiao ; Fan Hui

In recent years, electronic mutual-inductor and IEC61850 serial standards are adopted in digital substation. Once electronic mutual-inductor has been used, the input signals of relay protection and other secondary devices are not the traditional analog quantities any more. The simulation system cannot offer such interface up to now, so the secondary devices which are based on electronic mutual-inductor in digital substation cannot be tested and researched in this way. A kind of testing system aiming to real-time digital relay protection is introduced in this paper. By adding secondary interface to the primary simulation system, such as ADPSS (invented by China Electric Power Research Institute), a closed-loop testing system which is based on IEC61850 standards is established. The testing results verify that the system has great significance on improving the application of digital substation, and it has great use value.

Published in:
Advanced Power System Automation and Protection (APAP), 2011 International Conference on  (Volume:2 )

Date of Conference: 16-20 Oct. 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.