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Measurement of hybrid-π equivalent circuit parameters of bipolar junction transistors in undergraduate laboratories

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4 Author(s)
Phang, C.H. ; Dept. of Electr. & Comput. Eng., Queensland Univ., Qld., Australia ; Yeow, Y.T. ; Barham, R.A. ; Allen, P.J.

In this paper we report on a simple and accurate technique for the measurement of the small-signal y-parameters of a bipolar transistor at a given DC bias using a standard LCR meter which is readily available in undergraduate electronics laboratories. We demonstrate how the hybrid-π equivalent circuit of the transistor can be extracted from the measurement using a spreadsheet. Practical results are presented and the accuracy of the extracted hybrid-π parameters is checked by comparison between PSPICE simulation and actual measurement of the frequency response of a common-emitter amplifier built with the transistor in question

Published in:

Education, IEEE Transactions on  (Volume:40 ,  Issue: 3 )

Date of Publication:

Aug 1997

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