Cart (Loading....) | Create Account
Close category search window

Comparison of flicker noise in single layer, AMR and GMR sandwich magnetic film devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Wan, H. ; Solid State Electron. Center, Honeywell Inc., Plymouth, MN, USA ; Bohlinger, M.M. ; Jenson, M. ; Hurst, A.

Flicker noise comparison has been made on single layer NiFeCo, Sandwich AMR NiFeCo/TaN/NiFeCo and GMR NiFeCo/CoFe/Cu/CoFe/NiFeCo films. In a single magnetic domain state, AMR films have noise close to the thermal noise, GMR has 2-3 times higher noise, and in a state having a useful MR ratio, the GMR film has 10 times higher noise than AMR sandwich film, while the sandwich film has 10 times higher noise than single layer AMR film

Published in:

Magnetics, IEEE Transactions on  (Volume:33 ,  Issue: 5 )

Date of Publication:

Sep 1997

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.