By Topic

Reliability Analysis of k -out-of- n Systems With Single Cold Standby Using Pearson Distributions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Arjan J. C. van Gemund ; Faculty of Electrical Engineering, Mathematics, and Computer Science, Delft University of Technology, GA Delft, The Netherlands ; Gerard L. Reijns

k-out-of-n systems with cold standby units are typically studied for unit lifetime distributions that allow analytical tractability. Often, however, these distributions differ significantly from reality. In this paper, we present an analytical approach to compute the mean failure time for k -out-of-n systems with a single cold standby unit for the wide class of lifetime distributions that can be captured by the Pearson distribution. The method requires the first four statistical moments of the unit's lifetime distribution to be given, and computes the mean failure time using the Pearson distribution as an intermediate vehicle during the numerical integration. Experimental results for various instances of the Weibull distribution show that the numerical accuracy of the approach is high, with less than 0.5 percent error across a large range of k -out-of-n systems.

Published in:

IEEE Transactions on Reliability  (Volume:61 ,  Issue: 2 )