By Topic

An Integrated Embedded System for Evaluating Performance Parameters of CMOS Image Sensor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Chien-Hung Chen ; Instrum. Technol. Res. Center, Nat. Appl. Res. Labs., Hsinchu, Taiwan ; Tai-Shan Liao ; Chi-Hung Hwang

This paper introduces a CMOS-image-sensor-performance evaluation system that can compute parameters including pixelwise dynamic range, dynamic linearity, signal-to-noise ratio, and chip-level dynamic uniformity with a single measurement. The proposed system offers a simpler and significantly more integrated approach than the available systems by employing an embedded processing system and a large-data-processing method with multithreading capability. This paper also presents a new optimization technique to overcome the memory-size limitations of embedded systems for larger data-processing applications. The proposed system is designed and implemented to target small business applications and laboratories conducting research on CMOS quality sensors.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:61 ,  Issue: 8 )