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This paper introduces a CMOS-image-sensor-performance evaluation system that can compute parameters including pixelwise dynamic range, dynamic linearity, signal-to-noise ratio, and chip-level dynamic uniformity with a single measurement. The proposed system offers a simpler and significantly more integrated approach than the available systems by employing an embedded processing system and a large-data-processing method with multithreading capability. This paper also presents a new optimization technique to overcome the memory-size limitations of embedded systems for larger data-processing applications. The proposed system is designed and implemented to target small business applications and laboratories conducting research on CMOS quality sensors.