Cart (Loading....) | Create Account
Close category search window

Optimal Cell Topology Constraint for Monolayer Dual-Polarized Beamscanning Reflectarrays

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Perruisseau-Carrier, J. ; Adaptive Micro Nano Wave Syst. Group, Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland

This letter relates to the development of satellite reflectarrays able to scan a single dual-polarized beam, based on monolayer resonating cells embedding digital microelectromechanical systems (MEMS). We study general topology constraints to be imposed on the elementary cell to ensure dual-polarized operation, minimal cross-polarization, and a reduced number of MEMS for a given phase resolution. It is shown that an element electrically invariant to a 90° rotation is the most favorable one, and the theoretical considerations are verified by a design example under both normal and oblique incidence.

Published in:

Antennas and Wireless Propagation Letters, IEEE  (Volume:11 )

Date of Publication:


Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.