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Distribution of coercivity and anisotropy through thickness direction in sputtered Co-Cr films and its relationship to noise characteristics in perpendicular magnetic recording

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3 Author(s)
Nakagawa, S. ; Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan ; Takayama, S. ; Naoe, Masahiko

The relationship between c-axis orientation of crystallites and distribution of the perpendicular coercivity Hc⊥ in Co-Cr films has been investigated through the evaluation of the Hc⊥ of surface layer Hc⊥(s) measured by a Kerr hysteresis loop tracer. Better c-axis orientation, higher Cr content and addition of Ta seemed to be essential requirements to get higher Hc⊥ of initial growth layer Hc⊥(i) and good uniformity of Hc⊥ through the thickness direction. Lower ΔHc and relatively high Hc⊥(i) caused better recording characteristics and lower media noise level

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Magnetics, IEEE Transactions on  (Volume:33 ,  Issue: 5 )