Cart (Loading....) | Create Account
Close category search window
 

Phase-Aware Multitone Digital Signal Based Test for RF Receivers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Zeidan, M.A. ; Nat. Instrum., Austin, TX, USA ; Banerjee, G. ; Gharpurey, R. ; Abraham, J.A.

This paper presents a method for testing RF receivers that utilizes a multitone digital signal generation scheme and relies on the analysis of the receiver baseband output to compute the RF performance parameters. The proposed method eliminates the cost of expensive RF instrumentation on the input side of receiver testing and only requires low-cost on-chip baseband digitization at the output of the receiver. The complexity of the RF signal generation inherent to standard methods is traded off with extensive signal processing in the baseband. The analysis necessary for tackling the problem of extracting RF metrics is addressed and presented herein. Whereas the proposed test scheme was implemented and experimentally verified on a load board for testing UHF receivers, generalized use in BIST applications in need of multi-GHz RF stimuli is also discussed in the paper. RF performance parameters like Gain, Noise Figure (NF), and IIP3 were simulated and measured using both standard methods and the proposed method and, the results are shown to be accurate to within 0.5 dB for Gain and 1 dB for NF and IIP3.

Published in:

Circuits and Systems I: Regular Papers, IEEE Transactions on  (Volume:59 ,  Issue: 9 )

Date of Publication:

Sept. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.