By Topic

Stability and yield-oriented ultra-low-power embedded 6T SRAM cell design optimization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Makosiej, A. ; Inst. Super. d''Electron. de Paris, Paris, France ; Thomas, O. ; Vladimirescu, A. ; Amara, A.

This paper presents a methodology for the optimal design of CMOS 6T SRAM ultra-low-power (ULP) bitcells minimizing power consumption under strict stability constraints in all operating modes. An accurate analytical SRAM subthreshold model is developed for characterizing the cell behavior and optimizing its performance. The proposed design approach is demonstrated for an SRAM implemented in a 32nm CMOS UTBB-FDSOI technology. Stable operation in both read and write is obtained for the optimized cell at VDD=0.4V. Moreover, in the optimization process the standby and active power were reduced up to 10x and 3x, respectively.

Published in:

Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012

Date of Conference:

12-16 March 2012