By Topic

Traceable Technique to Calibrate Clamp Meters in AC Current From 100 to 1500 A

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Galliana, F. ; Nat. Inst. of Metrol. Res. (INRIM), Torino, Italy ; Capra, P.P.

A measurement technique to calibrate current clamp meters in ac current in the measurement range from 100 to 1500 A at 50 Hz has been developed at the National Institute of Metrological Research (INRIM) in addition to the primary reference measurement systems for ac current calibrations at INRIM. This technique is traceable to the national standards of dc resistance, dc voltage, and ac current ratio. It is based on a standard current transformer (CT), on a 50-mΩ standard shunt, and on a 61/2-digit digital voltmeter (DVM) that measures the voltage on the standard shunt inserted in a conductor, to which also the clamp meter is applied, whose current is supplied by a CT that can generate currents up to 1500 A. The CT is controlled by a variable transformer. The clamp meter is applied to a copper wire and placed on a tilting support simulating the actual operating mode of the meter. This measurement technique is applicable in industrial metrological laboratories and is an alternative to measurement practices of accredited secondary laboratories involving digital calibrators and turn current coils. This measurement technique was also tested utilizing an 81/2-digit high-accuracy DVM. The results of the evaluation are presented and discussed. The expanded (k = 2) uncertainties of the technique span from 1.0 × 10-2 at 100 A to 2.0 ×10-3 at 1500 A.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:61 ,  Issue: 9 )