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A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection.
Published in:
Review of Scientific Instruments
(Volume:83
,
Issue:
3
)
Date of Publication: Mar 2012
- Page(s):
- 033302 - 033302-12
- ISSN :
- 0034-6748
- Digital Object Identifier :
- 10.1063/1.3694997
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 03 April 2012
- Issue Date :
- Mar 2012
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