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2^{n} Pattern Run-Length for Test Data Compression

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4 Author(s)
Lung-Jen Lee ; Dept. of Electron. Eng., Army Acad., Taoyuan, Taiwan ; Wang-Dauh Tseng ; Rung-Bin Lin ; Cheng-Ho Chang

This paper presents a new pattern run-length compression method whose decompressor is simple and easy to implement. It encodes 2|n| runs of compatible or inversely compatible patterns, either inside a single test data segment or across multiple test data segments. Experimental results show that it can achieve an average compression ratio of 67.64% and considerable test application time savings.

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:31 ,  Issue: 4 )