Cart (Loading....) | Create Account
Close category search window
 

Viterbi-Based Efficient Test Data Compression

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Dongsoo Lee ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA ; Roy, K.

This paper presents a Viterbi-based test compression algorithm/architecture that provides high encoding efficiency and scalability with respect to the number of test channels. The proposed scheme finds a set of compressed test vectors using the Viterbi algorithm instead of solving linear equations. By assigning a cost function to the branch metric of the Viterbi algorithm, an optimal compressed vector is selected among the possible solution set. This feature enables high flexibility to combine various test requirements such as low-power compression and/or improving capability to repeat test patterns. The proposed on-chip decompressor follows the structure of Viterbi encoders which require only one input channel. Experimental results on test volume show improvement on all ISCAS89 benchmark circuits (19.32% reduction on the average) compared to previous test data compression architectures. The proposed scheme also yields efficient power-dissipation/volume tradeoff.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:31 ,  Issue: 4 )

Date of Publication:

April 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.