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Comparative Analysis of MIS Capacitance Structures With High-k Dielectrics Under Gamma, ^{16} O and p Radiation

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8 Author(s)
C. P. Quinteros ; Consejo Nacional de Investigaciones Científicas y Técnicas (CONICET) and CNEA, San Martín (1650), Argentina ; L. Sambuco Salomone ; E. Redin ; J. M. Rafi
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MIS capacitance structures, with Hafnium Oxide, Alumina and nanolaminate as dielectrics were studied under gamma photons ^{60}{\hbox {Co}} , 25 MeV oxygen ions and 10 MeV protons radiation using capacitance-voltage (C-V) characterization.

Published in:

IEEE Transactions on Nuclear Science  (Volume:59 ,  Issue: 4 )