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Browse Journals & Magazines > Nuclear Science, IEEE Transac ...> Volume:59 Issue:4 Help

Comparative Analysis of MIS Capacitance Structures With High-k Dielectrics Under Gamma, ^{16} O and p Radiation

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8 Author(s)
Quinteros, C.P. ; Consejo Nacional de Investigaciones Científicas y Técnicas (CONICET) and CNEA, San Martín (1650), Argentina ; Salomone, L.S. ; Redin, E. ; Rafi, J.M.
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MIS capacitance structures, with Hafnium Oxide, Alumina and nanolaminate as dielectrics were studied under gamma photons $^{60}{hbox{Co}}$, 25 MeV oxygen ions and 10 MeV protons radiation using capacitance-voltage (C-V) characterization.

Published in:
Nuclear Science, IEEE Transactions on  (Volume:59 ,  Issue: 4 )

Date of Publication: Aug. 2012

Page(s):
767 - 772
ISSN :
0018-9499
Digital Object Identifier :
10.1109/TNS.2012.2187217
Product Type:
Journals & Magazines
Date of Publication :
16 March 2012
Date of Current Version :
14 August 2012
Issue Date :
Aug. 2012
Sponsored by :
IEEE Nuclear and Plasma Sciences Society

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