Cart (Loading....) | Create Account
Close category search window
 

Enhancing the Performance of Active Shape Models in Face Recognition Applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Behaine, C.A.R. ; Grad. Programme on Electr. Eng., Fed. Univ. of Rio Grande do Sul, Porto Alegre, Brazil ; Scharcanski, J.

Biometric features in face recognition systems are one of the most reliable and least intrusive alternatives for personal identity authentication. Active shape model (ASM) is an adaptive shape matching technique that has been used often for locating facial features in face images. However, the performance of ASM can degrade substantially in the presence of noise or near the face frame contours. In this correspondence, we propose a new ASM landmark selection scheme to improve the ASM performance in face recognition applications. The proposed scheme selects robust landmark points where relevant facial features are found and assigns higher weights to their corresponding features in the face classification stage. The experimental results are promising and indicate that our approach tends to enhance the performance of ASM, leading to improvements in the final face classification results.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:61 ,  Issue: 8 )

Date of Publication:

Aug. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.