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System Approach for Reliability of Low-power Power Electronics; How to Break Down into Their Constructed Parts

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4 Author(s)
S. Tarashioon ; Mater. innovation Inst. (M2i), Delft, Netherlands ; S. Tarashioon ; W. D. van Driel ; G. Q. Zhang

This paper presents a new method for breaking down a low-power power electronics device into its constructed parts used for reliability study of the device. The exceptional feature of this new method is to break down the device into two main parts: function elements and packaging elements. This method can help for a much better prioritizing the failures in the device, and also with having more structured reliability procedure it will be more possibility to apply it in a computer program. The advantage of this method over the existing methods is discussed and also how it can be applied for studying reliability of whole system.

Published in:

2012 7th International Conference on Integrated Power Electronics Systems (CIPS)

Date of Conference:

6-8 March 2012