Cart (Loading....) | Create Account
Close category search window
 

Partial shape classification using contour matching in distance transformation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Liu, H.-C. ; Inst. of Nucl. Energy Res., Lung-Tan, Taiwan ; Srinath, M.D.

An algorithm is presented to recognize and locate partially distorted 2D shapes without regard to their orientation, location, and size. The algorithm first calculates the curvature function from the digitized image of an object. The points of local maxima and minima extracted from the smooth curvature are used as control points to segment the boundary and to guide the boundary-matching procedure. The boundary-matching procedure considers two shapes at a time, one shape from the template databank, and the other from the object being classified. The procedure tries to match the control points in the unknown shape to those of a shape from the template databank, and estimates the translation, rotation, and scaling factors to be used to normalize the boundary of the unknown shape. The chamfer 3/4 distance transformation and a partial distance measurement scheme constitute the final step in measuring the similarity between the two shapes. The unknown shape is assigned to the class corresponding to the minimum distance. The algorithm has been successfully tested on partial shapes using two sets of data, one with sharp corners and the other with curve segments. This algorithm not only is computationally simple, but also works reasonably well in the presence of a moderate amount of noise

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:12 ,  Issue: 11 )

Date of Publication:

Nov 1990

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.