Cart (Loading....) | Create Account
Close category search window

Diffraction-Limited Infrared-Imaging of the Near-Field Intensity Emitted by Quantum-Cascade Lasers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Kinzer, M. ; Fraunhofer Inst. for Appl. Solid State Phys., Freiburg, Germany ; Yang, Q.K. ; Hugger, S. ; Brunner, M.
more authors

The near-field intensity distributions of quantum-cascade lasers emitting at λ = 7.7 μm were investigated with a Gaussian telescope, comprising standard optical components together with a microbolometer focal plane array. Although the technique is operated at the diffraction limit, the quality of the near-field patterns obtained allows unambiguous determination of the lateral-mode structure of the laser even for individual laser pulses. The high quality of the recorded near-field intensity distribution allows us to calculate analytically the corresponding far-field intensity distributions, leading to an excellent match with measured far-field patterns. The present experimental technique allows fast and efficient characterization of the beam propagation properties of mid-infrared semiconductor lasers.

Published in:

Quantum Electronics, IEEE Journal of  (Volume:48 ,  Issue: 5 )

Date of Publication:

May 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.