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Metal-oxide-semiconductor field effect transistor humidity sensor using surface conductance

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6 Author(s)
Song, Seok-Ho ; Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 305-701, South Korea ; Yang, Hyun-Ho ; Han, Chang-Hoon ; Ko, Seung-Deok
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Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3691936 

This letter presents a metal-oxide-semiconductor field effect transistor based humidity sensor which does not use any specific materials to sense the relative humidity. We simply make use of the low pressure chemical vapor deposited (LPCVD) silicon dioxide’s surface conductance change. When the gate is biased and then floated, the electrical charge in the gate is dissipated through the LPCVD silicon dioxide’s surface to the surrounding ground with a time constant depending on the surface conductance which, in turn, varies with humidity. With this method, extremely high sensitivity was achieved—the charge dissipation speed increased thousand times as the relative humidity increased.

Published in:
Applied Physics Letters  (Volume:100 ,  Issue: 10 )

Date of Publication: Mar 2012

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