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Elimination of Te Inclusions in {\rm Cd}_{1-x}{\rm Zn}_{x}{\rm Te} Crystals by Short-term Thermal Annealing

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15 Author(s)
P. Fochuk ; Chernivtsi National University, Chernivtsi, Ukraine ; R. Grill ; O. Kopach ; A. E. Bolotnikov
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The presence of Te inclusions degrades the quality of today's CdZnTe (CZT) crystals used for Xand gamma-ray detectors; both their sizes and concentrations densities must be reduced. Over the past years, many researchers proposed using long-term annealing (>;24 h) under Cd vapor pressure to reduce or even eliminate the inclusions visible under IR microscopes. We annealed detector-grade CZT samples for periods of 15 to 60 min under Cd-, Zn-, or Te-overpressure or in vacuum at 1000-1200 K. We determined the optimal temperature, duration, and the vapor atmosphere for such high-temperature annealing, typically at ~1100 K for 0.5-1.0 h. The results were very promising in eliminating Te-rich inclusions, even on twins where the inclusions are more stable than in the unperturbed lattice; indeed, we saw almost no inclusions whatsoever by IR transmission microscopy after such annealing. We note that eliminating inclusions at lower temperatures takes much longer. However, annealing under a Cd vapor pressure at temperatures above ~1170 K generates a large quantity of irregular Cd inclusions. The samples' resistance after annealing was estimated by I-V curves.

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IEEE Transactions on Nuclear Science  (Volume:59 ,  Issue: 2 )