Cart (Loading....) | Create Account
Close category search window

Verifying dynamic power management schemes using statistical model checking

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kumar, J.A. ; Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA ; Vasudevan, S.

Dynamic power management (DPM) schemes, such as power gating, are important runtime strategies for saving power in multicore architectures. Safety and efficiency are probabilistic properties which need to be verified in order to evaluate a DPM scheme. In this work, we employ statistical model checking to verify probabilistic properties on Register Transfer Level (RTL) descriptions of multicores. Statistical model checking performs a system-level verification of the DPM scheme by simulating several sample paths of the entire RTL design until the verification results lie within tolerable bounds of error. We illustrate our approach on the RTL of OpenSPARC T2, a publicly available industry-strength multicore processor. We verify the safety and efficiency properties of several power gating schemes by considering the power manageable blocks in the floating-point graphics unit.

Published in:

Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific

Date of Conference:

Jan. 30 2012-Feb. 2 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.