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X-ray dosimeters were developed by tailoring novel injecting diamond-like-carbon/Pt/Au contacts on single-crystal high-purity diamond films. A dark resistivity of (5.6 ± 0.1) × 1014 Ω · cm and no appreciable presence of deep traps in the bandgap confirmed a very low defect density in the diamond films. The dosimeters resulted to be primingless (i.e., no need of preactivation) and characterized by high sensitivity [(58.20 ± 3.26) × 10-3 C · Gy-1 cm-3] and linear response to X-ray dose rate, produced by a molybdenum target. Transient X-ray modulated analysis allowed the determination of fast-trap influence and the estimation of very fast response times (~10-3 s), at electric fields ≥ 3 × 103 V/cm.