Close category search window
 

Digital Reflectarray Considerations for Terrestrial Millimeter-Wave Imaging

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Dietlein, C.R. ; RDRL-SER-M, U.S. Anny Res. Lab., Adelphi, MD, USA ; Hedden, A.S. ; Wikner, D.A.

We investigate how realistic architecture considerations affect the performance of wafer-scale electronically scanned millimeter-wave reflectarrays. Considering the application of a confocal Gregorian optics geometry with a small angular field of view, we examine how a reflectarray's discrete (digital) phase state quantization and electrical size impact scan angle accuracy and quantization lobe performance degradation. We quantify the impact of these effects on the camera's imaging performance and show that, for these reflectarrays, phase quantization of 2 bits is sufficient.

Published in:
Antennas and Wireless Propagation Letters, IEEE  (Volume:11 )

Date of Publication: 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.