Close category search window
 

Multisignal Compressed Sensing for Polarimetric SAR Tomography

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Aguilera, E. ; Microwaves & Radar Inst. (HR, German Aerosp. Center (DLR), Wessling, Germany ; Nannini, M. ; Reigber, A.

In recent years, 3-D imaging by means of polarimetric synthetic aperture radar (SAR) sensors has become a field of intensive research. In SAR tomography, the vertical reflectivity function for every azimuth-range pixel is usually recovered by processing data collected using a defined repeat-pass acquisition geometry. The most common approach is to generate a synthetic aperture in the elevation direction through imaging from a large number of parallel tracks. This imaging technique is appealing, since it is very simple. However, it has the drawback that large temporal baselines can severely affect the reconstruction. In an attempt to reduce the number of parallel tracks, we propose a new approach that exploits structural correlations between neighboring azimuth-range pixels and/or polarimetric channels. As a matter of fact, this can be done under the framework of distributed compressed sensing (CS) (DCS), which stems from CS theory, thus also exploiting sparsity in the tomographic signal. Finally, results demonstrating the potential of the DCS methodology will be validated by using fully polarimetric L-band data acquired by the E-SAR sensor of the German Aerospace Center (DLR).

Published in:
Geoscience and Remote Sensing Letters, IEEE  (Volume:9 ,  Issue: 5 )

Date of Publication: Sept. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.